Microtrace acquires new Field Emission Electron Microscope
Microtrace acquires the JEOL JSM-7100FT field emission scanning electron microscope, which offers a through-the-lens detector, energy filtering, and beam deceleration for low kV imaging. The system is equipped with an Oxford 50 mm2 silicon drift detector. This microscope complements our existing scanning and transmission electron microscopes.
Read more about this technique on our website.