News from Microtrace
New Instrument- Electron Backscatter Diffraction (EBSD) System
Microtrace recently added an electron backscatter diffraction (EBSD) system. This supplement to the FE-SEM provides crystallographic and microstructural information. EBSD data can be applied to numerous applications including industrial or metallurgical samples as well as forensic paint analysis and geosourcing of soils. Read More
Microtrace Scientists at NIST/OSAC Meeting
This week (July 9-12, 2019) several Microtrace scientists will attend OSAC's (Organization for Scientific Area Committees) forensic science meetings in Orlando, Florida. While there, they will advise and collaborate on the development of new scientific standards. Read More
Happy Independence Day!
Happy 4th of July! Here, we offer some brief thoughts on the chemistry of fireworks. Read More
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Recent Publications
Trace Evidence Presentation at Public Defender Forensic Science Conference
On 30 May 2019, Microtrace's Skip Palenik and Jason Beckert talked about trace evidence at the annual forensic science conference of Forensic Science Division of the Cook County Public Defender Office. Read More
Microtrace’s Breadth of Expertise at Inter/Micro 2019
Next week, microscopists from around the world are gathering in Chicago for Inter/Micro 2019- the premier international microscopy conference. Seven Microtrace scientists are presenting papers at the conference. Read More
Sub‐visible Paint Article by Microtrace Scientists
The Journal of Forensic Sciences published an article by Microtrace scientists Christopher Palenik, Ethan Groves, Joseph Insana, and Skip Palenik, entitled "Locating, Identifying, and Comparing Sub‐visible Paint Particles." Read More