Thin film in multilayer laminate
A multilayer laminate film was submitted for the characterization of a thin, middle layer. To visualize the layer structure of the film, samples were embedded and polished using a ion beam cross section polishing system. This visualization technique provided a clear picture of the number of layers (which was greater than the client’s expectations) and the layer thicknesses.
The particular layers of interest measured approximately 2 micrometers. The layer of interest was isolated for chemical analysis, which allowed us to identify the chemical composition of the layer, which turned out to be an adhesive. The adjacent polymer layer, which was loaded with rutile and calcite (identified by Raman microspectroscopy) was identified as was the adjacent 350 nm thick layer which was composed of an alumino-silicate and quartz.
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